10th IEEE INTERNATIONAL TEST CONFERENCE INDIA 2026

JULY 19-21, 2026 | RADISSON BLU, MARATHAHALLI, BENGALURU

Academia Research Track

International Test Conference, the world’s premier venue dedicated to the electronic test of devices, boards and systems, will host a dedicated Academia Research Track (ART) to manifest creative research ideas from students and young academicians. The key objective of this academia track, first time planned to be held with the International Test Conference, is to provide a dedicated informal forum for vigorous creative discussion and debate of this area from researchers of various academic institutes. The aim is to encourage the oral/poster presentation with discussion on truly innovative and “out-of-the-box” ideas that may not yet have been fully developed for presentation at reviewed conferences to address these challenges.

Students and young academicians are invited to submit original and high quality research work or innovative idea to this track. Selected ideas will interact with dedicated panel from industry to further extended the research work of common interests. ART is a platform of presenting late-breaking ideas, getting feedback on an innovative method, or participating without having to write a full paper.

Submission Guidelines

  • One or two topic(s) from the topic list, or a description of your topic.
  • An abstract of 100 words or less to be entered online.
  • An electronic copy of the paper up to 3 pages or an extended summary up to 4 pages, double-columned in IEEE Format (Paper template).
  • Your submission must include the problem statement and novelty of solution(s). It should not include information that serves to identify the authors of the manuscript, such as name(s) or affiliation(s) of the author(s). References and bibliographic citations to the author(s) own published works or affiliations should be made in the third person.

Selection Criteria

  • Abstracts will be selected based on the novelty of the work and its relevance to the conference. The selected abstracts would be later either categorized into poster presentation or oral presentation, solely based on the merit.
  • Upon receiving the acceptance notification, the author will be informed if the paper is classified as a regular full paper or a poster.
  • If the submission got accepted under full paper category, it will be considered for inclusion into IEEE Xplore subject to meeting IEEE Xplore’s scope and quality requirements.

Additional Benefits

  • Registration fee waiver and partial or full travel support will be provided through fellowship.
  • Long term research plan with industry, if research interests align.
  • High Impact Research award will be presented in conference banquet.

Topics of Interest

Include (not limited to):

RF, mm-Wave and THz Testing
Embedded BIST & DFT
3D/2.5D Test
Emerging Defect Mechanisms
Adaptive Test in Practice
Hardware Security and Trust
ATE/Probe Card Design
Known-Good-Die testing
Advances in Boundary Scan
Memory Test and Repair
Data Driven Methods
MEMS Testing
Data Exchange and Infrastructure
Mixed-Signal and Analog Test
Defect-Oriented Testing
New Technologies and Test
DFM and Test Diagnosis
On-Chip Test Compression
Economics of Test
Online Test
End-to-End Data Analysis
Pre- and Post-Silicon Validation
Bring Up
System Test (Applications)
Power Issues in Test
System Test (Hardware/Software)
Protocol-aware Test
Test-to-Design Feedback
Reliability and Resilience
Test Escape Analysis
Scan Based Test
SoC/SiP/NoC Test
Silicon Debug
IoT Testing
Simulation and Test
Jitter, High-Speed I/O and RF Test
Test Flow Optimizations
Test Generation and Validation
Test Resource Partitioning
Test Standards
Test Time Analysis and Reduction
Testing High Speed Optics/Photonics
Yield Analysis and Optimization

Submit Research

Share your innovative ideas and research with the community.

SUBMIT ACADEMIA RESEARCH TRACK

Need Help?

For questions regarding the program or submission process, please contact us.

Website:itctestweekindia.org

Email:ITC-India-2026-TPC@easychair.org